[WSonic]

Покажите смарт накопителя, укажите модель матплаты и процессора

[Eldignis]

SMART накопителя во вложениях, спасибо за ответ.

Диск использовался на ASUS P8Z77-V LX и на Esonic.

Вывод Smartctl:

Скрытый текст

smartctl 7.0 2018-12-30 r4883 [x86_64-linux-4.15.0-50-generic] (local build)
Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model: SSD 240GB
Serial Number: YF0633YFB71823001372
Firmware Version: Q1115A0
User Capacity: 240 057 409 536 bytes [240 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Thu May 30 01:12:36 2019 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x11) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x0032 100 100 050 Old_age Always - 0
5 Reallocated_Sector_Ct 0x0032 100 100 050 Old_age Always - 8
9 Power_On_Hours 0x0032 100 100 050 Old_age Always - 242
12 Power_Cycle_Count 0x0032 100 100 050 Old_age Always - 313
160 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 178
161 Unknown_Attribute 0x0033 100 100 050 Pre-fail Always - 87
163 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 10
164 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 22901
165 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 4784
166 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 2
167 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 47
168 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 7000
169 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 100
175 Program_Fail_Count_Chip 0x0032 100 100 050 Old_age Always - 0
176 Erase_Fail_Count_Chip 0x0032 100 100 050 Old_age Always - 0
177 Wear_Leveling_Count 0x0032 100 100 050 Old_age Always - 0
178 Used_Rsvd_Blk_Cnt_Chip 0x0032 100 100 050 Old_age Always - 8
181 Program_Fail_Cnt_Total 0x0032 100 100 050 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 050 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 050 Old_age Always - 59
194 Temperature_Celsius 0x0022 100 100 050 Old_age Always - 40
195 Hardware_ECC_Recovered 0x0032 100 100 050 Old_age Always - 323
196 Reallocated_Event_Count 0x0032 100 100 050 Old_age Always - 178
197 Current_Pending_Sector 0x0032 100 100 050 Old_age Always - 8
198 Offline_Uncorrectable 0x0032 100 100 050 Old_age Always - 178
232 Available_Reservd_Space 0x0032 100 100 050 Old_age Always - 87
241 Total_LBAs_Written 0x0030 100 100 050 Old_age Offline - 42988
242 Total_LBAs_Read 0x0030 100 100 050 Old_age Offline - 41340
245 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 256980

SMART Error Log Version: 1
Warning: ATA error count 0 inconsistent with error log pointer 4

ATA Error Count: 0
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error -3 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 40

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec 00 01 00 00 00 00 08 00:00:00.000 IDENTIFY DEVICE
b0 da 00 00 4f c2 00 08 00:00:00.000 SMART RETURN STATUS
b0 d0 01 00 4f c2 00 08 00:00:00.000 SMART READ DATA
b0 d5 01 06 4f c2 00 08 00:00:00.000 SMART READ LOG
b0 d5 01 01 4f c2 00 08 00:00:00.000 SMART READ LOG

Error -4 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 40 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d0 01 00 4f c2 00 08 00:00:00.000 SMART READ DATA
b0 d1 01 01 4f c2 00 08 00:00:00.000 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
b0 da 00 00 4f c2 00 08 00:00:00.000 SMART RETURN STATUS
b0 d5 01 00 4f c2 00 08 00:00:00.000 SMART READ LOG
b0 d5 01 01 4f c2 00 08 00:00:00.000 SMART READ LOG

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 241 -

Selective Self-tests/Logging not supported